Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Defect mitigation and root cause studies in 14 nm half-pitch chemo-epitaxy directed self-assembly LiNe flow
Publication:
Defect mitigation and root cause studies in 14 nm half-pitch chemo-epitaxy directed self-assembly LiNe flow
Date
2015
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
31734.pdf
7.6 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pathangi Sriraman, Hari
;
Chan, BT
;
Bayana, Hareen
;
Vandenbroeck, Nadia
;
Van Den Heuvel, Dieter
;
Van Look, Lieve
;
Rincon Delgadillo, Paulina
;
Cao, Yi
;
Kim, JiHoon
;
Lin, Guanyang
;
Parnell, Doni
;
Nafus, Kathleen
;
Harukawa, Ryota
;
Chikashi, Ito
;
Polli, Marco
;
D'Urzo, Lucia
;
Gronheid, Roel
;
Nealey, Paul
Journal
Journal of Micro/Nanolithography MEMS and MOEMS
Abstract
Description
Metrics
Views
2014
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
2014
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations