Publication:
Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing
| dc.contributor.author | Luso, Domenico | |
| dc.contributor.author | Chatterjee, S. | |
| dc.contributor.author | Heylen, R. | |
| dc.contributor.author | Cornelissen, S. | |
| dc.contributor.author | De Beenhouwer, Jan | |
| dc.contributor.author | Sijbers, Jan | |
| dc.contributor.imecauthor | Luso, Domenico | |
| dc.contributor.imecauthor | De Beenhouwer, Jan | |
| dc.contributor.imecauthor | Sijbers, Jan | |
| dc.contributor.orcidimec | Luso, Domenico::0000-0001-7919-7878 | |
| dc.contributor.orcidimec | De Beenhouwer, Jan::0000-0001-5253-1274 | |
| dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
| dc.date.accessioned | 2023-03-30T12:20:46Z | |
| dc.date.available | 2023-02-16T03:20:14Z | |
| dc.date.available | 2023-03-30T12:20:46Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work is financially supported by the VLAIO ICON project VIL (HBC.2019.2808) and the Research Foundation -Flanders (FWO) (S004217N, S003421N) and the Flemish Government under the "Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen" programme. | |
| dc.identifier.doi | 10.1117/12.2633318 | |
| dc.identifier.eisbn | 978-1-5106-5469-3 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41109 | |
| dc.publisher | SPIE-INT SOC OPTICAL ENGINEERING | |
| dc.source.beginpage | 122421K | |
| dc.source.conference | SPIE's Conference on Developments in X-Ray Tomography XIV | |
| dc.source.conferencedate | AUG 22-24, 2022 | |
| dc.source.conferencelocation | San Diego | |
| dc.source.journal | Proceedings of SPIE | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 12242 | |
| dc.title | Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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