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Experimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs
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Experimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs
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Date
2016
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33899.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sodan, Vice
;
Kosemura, Daisuke
;
Stoffels, Steve
;
Oprins, Herman
;
Baelmans, Martine
;
Decoutere, Stefaan
;
De Wolf, Ingrid
Journal
IEEE Transactions on Electron Devices
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1873
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Views
1873
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-10
Citations