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Conference contributions
Design of test modules for the analysis of MCM interconnects
Publication:
Design of test modules for the analysis of MCM interconnects
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Date
1996
Proceedings Paper
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1514.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Truzzi, Claudio
;
Beyne, Eric
;
Ringoot, Edwin
Journal
Abstract
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1884
since deposited on 2021-09-29
Acq. date: 2025-12-11
Citations
Metrics
Views
1884
since deposited on 2021-09-29
Acq. date: 2025-12-11
Citations