Publication:
Border traps in Ge/III-V channel devices: Analysis and reliability aspects
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1906 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-01-08
Citations
Metrics
Views
1906 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-01-08
Citations