Publication:

Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1908 since deposited on 2021-10-17
1last month
Acq. date: 2026-03-17

Citations

Statistics

Views

1908 since deposited on 2021-10-17
1last month
Acq. date: 2026-03-17

Citations