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Time Dependence of RF Losses in GaN-on-Si Substrates

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dc.contributor.authorCardinael, Pieter
dc.contributor.authorYadav, Sachin
dc.contributor.authorZhao, Ming
dc.contributor.authorRack, Martin
dc.contributor.authorLederer, Dimitri
dc.contributor.authorCollaert, Nadine
dc.contributor.authorParvais, Bertrand
dc.contributor.authorRaskin, Jean-Pierre
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.date.accessioned2022-08-31T07:56:50Z
dc.date.available2022-04-26T02:12:34Z
dc.date.available2022-08-01T14:44:20Z
dc.date.available2022-08-31T07:56:50Z
dc.date.issued2022-04-11
dc.description.wosFundingTextThe work of Pieter Cardinael was supported by the Fonds pour la Formation a la Recherche dans l'Industrie et dans l'Agriculture (FRIA), FNRS, Belgium.
dc.identifier.doi10.1109/LMWC.2022.3162028
dc.identifier.issn1531-1309
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39685
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage688
dc.source.endpage691
dc.source.issue6
dc.source.journalIEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
dc.source.numberofpages4
dc.source.volume32
dc.title

Time Dependence of RF Losses in GaN-on-Si Substrates

dc.typeJournal article
dspace.entity.typePublication
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