Publication:
New method to correct for the influence of organic contamination on intensity ratios in quantitative XPS
Date
| dc.contributor.author | Vereecke, Guy | |
| dc.contributor.author | Rouxhet, P. G. | |
| dc.contributor.imecauthor | Vereecke, Guy | |
| dc.contributor.orcidimec | Vereecke, Guy::0000-0001-9058-9338 | |
| dc.date.accessioned | 2021-10-14T11:53:46Z | |
| dc.date.available | 2021-10-14T11:53:46Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3991 | |
| dc.source.beginpage | 761 | |
| dc.source.endpage | 769 | |
| dc.source.issue | 8 | |
| dc.source.journal | Surface and Interface Analysis | |
| dc.source.volume | 27 | |
| dc.title | New method to correct for the influence of organic contamination on intensity ratios in quantitative XPS | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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