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Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology
Publication:
Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology
Date
2020
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Salahuddin, Shairfe Muhammad
;
Dentoni Litta, Eugenio
;
Gupta, Anshul
;
Ritzenthaler, Romain
;
Schaekers, Marc
;
Everaert, Jean-Luc
;
Yu, Hao
;
Vandooren, Anne
;
Ryckaert, Julien
;
Na, Myung Hee
;
Spessot, Alessio
Journal
IEEE Transactions on Electron Devices
Abstract
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2017
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations
Metrics
Views
2017
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations