Publication:

In situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems

Date

2003
Proceedings Paper
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dc.contributor.authorManca, Jean
dc.contributor.authorGoris, Ludwig
dc.contributor.authorKesters, Els
dc.contributor.authorLutsen, Laurence
dc.contributor.authorMartens, Tom
dc.contributor.authorHaenen, Ken
dc.contributor.authorNesladek, Milos
dc.contributor.authorSanna, Ornella
dc.contributor.authorVanderzande, Dirk
dc.contributor.authorD'Haen, Jan
dc.contributor.authorDe Schepper, Luc
dc.contributor.imecauthorKesters, Els
dc.contributor.imecauthorLutsen, Laurence
dc.contributor.imecauthorHaenen, Ken
dc.contributor.imecauthorNesladek, Milos
dc.contributor.imecauthorVanderzande, Dirk
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.date.accessioned2021-10-15T05:34:06Z
dc.date.available2021-10-15T05:34:06Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7853
dc.source.beginpage361
dc.source.conferenceFlexible Electronics. Materials and Device Technology
dc.source.conferencedate21/04/2003
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage367
dc.title

In situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems

dc.typeProceedings paper
dspace.entity.typePublication
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