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Recent advances in fundamental understanding of reliability phenomena in downscaled copper interconnects
Publication:
Recent advances in fundamental understanding of reliability phenomena in downscaled copper interconnects
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Croes, Kristof
;
Wilson, Chris
;
Lofrano, Melina
;
Beyer, Gerald
;
Tokei, Zsolt
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1892
since deposited on 2021-10-19
Acq. date: 2025-12-16
Citations
Metrics
Views
1892
since deposited on 2021-10-19
Acq. date: 2025-12-16
Citations