Publication:
Electrical characterization of leaky charge-trapping high-k MOS devices using pulsed Q-V
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1798 since deposited on 2021-10-16
1last month
Acq. date: 2025-12-16
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Views
1798 since deposited on 2021-10-16
1last month
Acq. date: 2025-12-16
Citations