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Diamond tips for electrical AFM measurements with sub-nanometer resolution
Publication:
Diamond tips for electrical AFM measurements with sub-nanometer resolution
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Tsigkourakos, Menelaos
;
Paredis, Kristof
;
Eyben, Pierre
;
Nuytten, Thomas
;
Schulze, Andreas
;
Vandervorst, Wilfried
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Abstract
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1947
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1947
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations