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Pattern dependent corrosion effects in HF based post-Cu CMP cleanings
Publication:
Pattern dependent corrosion effects in HF based post-Cu CMP cleanings
Date
2001
Proceedings Paper
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5309.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fyen, Wim
;
Teerlinck, Ivo
;
Lagrange, Sébastien
;
Brongersma, Sywert
;
Steegen, An
;
Mertens, Paul
;
Heyns, Marc
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1911
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations
Metrics
Views
1911
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations