Publication:

Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes

Date

2023
Proceedings Paper
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dc.contributor.authorMayahinia, Mahta
dc.contributor.authorLiu, Hsiao-Hsuan
dc.contributor.authorMishra, Subrat
dc.contributor.authorTokei, Zsolt
dc.contributor.authorCatthoor, Francky
dc.contributor.authorTahoori, Mehdi
dc.contributor.authormayahin
dc.contributor.authorhsiao
dc.contributor.imecauthorLiu, Hsiao-Hsuan
dc.contributor.imecauthorMishra, Subrat
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecMishra, Subrat::0000-0002-1435-3275
dc.contributor.orcidimecTokei, Zsolt::0000-0003-3545-3424
dc.date.accessioned2024-03-04T13:58:37Z
dc.date.available2023-08-19T18:09:54Z
dc.date.available2023-08-24T06:58:16Z
dc.date.available2024-03-04T13:58:37Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.identifier.eisbn979-8-3503-9624-9
dc.identifier.issn1530-1591
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42348
dc.publisherIEEE
dc.source.conferenceDesign, Automation and Test in Europe Conference and Exhibition (DATE)
dc.source.conferencedateAPR 17-19, 2023
dc.source.conferencelocationAntwerp
dc.source.journalN/A
dc.source.numberofpages6
dc.subject.keywordsElectromigration-aware design
dc.subject.keywordsSRAM in advanced technology nodes
dc.title

Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes

dc.typeProceedings paper
dspace.entity.typePublication
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