Publication:

Cobalt and Ruthenium drift in ultra-thin oxides

Date

2019
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorTierno, Davide
dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.authorWu, Chen
dc.contributor.authorJourdan, Nicolas
dc.contributor.authorKljucar, Luka
dc.contributor.authorTokei, Zsolt
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorTierno, Davide
dc.contributor.imecauthorVarela Pedreira, Olalla
dc.contributor.imecauthorWu, Chen
dc.contributor.imecauthorJourdan, Nicolas
dc.contributor.imecauthorKljucar, Luka
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTierno, Davide::0000-0003-4915-904X
dc.contributor.orcidimecWu, Chen::0000-0002-4636-8842
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.accessioned2021-10-27T19:41:12Z
dc.date.available2021-10-27T19:41:12Z
dc.date.issued2019
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34125
dc.identifier.urlhttps://doi.org/10.1016/j.microrel.2019.113407
dc.source.beginpage113407
dc.source.journalMicroelectronics Reliability
dc.source.volume100-101
dc.title

Cobalt and Ruthenium drift in ultra-thin oxides

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles