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Assessing reliability of nano-scaled CMOS technologies one defect at a time
Publication:
Assessing reliability of nano-scaled CMOS technologies one defect at a time
Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Grasser, Tibor
;
Franco, Jacopo
;
Toledano Luque, Maria
;
Weckx, Pieter
;
Roussel, Philippe
;
Groeseneken, Guido
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1925
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1925
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations