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Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps

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1969 since deposited on 2021-10-22
2last month
Acq. date: 2026-01-26

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Views

1969 since deposited on 2021-10-22
2last month
Acq. date: 2026-01-26

Citations