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Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
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Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vais, Abhitosh
;
Lin, Dennis
;
Dou, Chunmeng
;
Martens, Koen
;
Ivanov, Tsvetan
;
Xie, Qi
;
Tang, Fu
;
Givens, Michael
;
Maes, Jan
;
Collaert, Nadine
;
Raskin, Jean-Pierre
;
De Meyer, Kristin
;
Thean, Aaron
Journal
Applied Physics Letters
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1967
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations
Metrics
Views
1967
since deposited on 2021-10-22
Acq. date: 2025-12-10
Citations