Publication:

Defect-based methodology for workload-dependent circuit lifetime projections – application to SRAM

Date

2013

Proceedings Paper

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Files

26714.pdf 1.62 MB

Author(s)

;

;

Toledano Luque, Maria

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;

Roussel, Philippe

;

;

Raghavan, Praveen

;

Catthoor, Francky

;

Groeseneken, Guido

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1915 since deposited on 2021-10-21

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Acq. date: 2026-02-24