Publication:

Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration

Date

2000
Proceedings Paper
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dc.contributor.authorGillon, R.
dc.contributor.authorVan De Sype, Wim
dc.contributor.authorVanhoenacker, D.
dc.contributor.authorMartens, Luc
dc.contributor.imecauthorMartens, Luc
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.date.accessioned2021-10-14T13:00:13Z
dc.date.available2021-10-14T13:00:13Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4393
dc.source.beginpage241
dc.source.conferenceInternational Conference on Microelectronic Test Structures - ICMTS
dc.source.conferencedate13/03/2000
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage245
dc.title

Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration

dc.typeProceedings paper
dspace.entity.typePublication
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