Publication:
Probing 3D-semiconductors structures
Date
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-20T18:01:09Z | |
| dc.date.available | 2021-10-20T18:01:09Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21739 | |
| dc.source.conference | UK-Surface Analysis | |
| dc.source.conferencedate | 7/01/2012 | |
| dc.source.conferencelocation | Oxford UK | |
| dc.title | Probing 3D-semiconductors structures | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |