Publication:

Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs

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1889 since deposited on 2021-10-19
2last month
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Acq. date: 2026-01-08

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1889 since deposited on 2021-10-19
2last month
1last week
Acq. date: 2026-01-08

Citations