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Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs
Publication:
Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs
Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Cher Xuan
;
Zhang, E. Xia
;
Fleetwood, Dan M.
;
Schrimpf, Ronald D
;
Galloway, Kenneth F.
;
Simoen, Eddy
;
Mitard, Jerome
;
Claeys, Cor
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1885
since deposited on 2021-10-19
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Acq. date: 2025-10-24
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Metrics
Views
1885
since deposited on 2021-10-19
409
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations