Publication:

REVISITING NATURAL SCENE STATISTICAL MODELING USING DEEP FEATURES FOR OPINION-UNAWARE IMAGE QUALITY ASSESSMENT

Date

2022
Proceedings Paper
https://doi.org/10.1109/ICIP46576.2022.9898064
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-0908-1655
cris.virtual.orcid0000-0003-1006-1838
cris.virtualsource.department8722db29-0da3-40ce-9be7-3317c87c8a92
cris.virtualsource.department8916b106-a388-4b3a-a602-36138802b449
cris.virtualsource.orcid8722db29-0da3-40ce-9be7-3317c87c8a92
cris.virtualsource.orcid8916b106-a388-4b3a-a602-36138802b449
dc.contributor.authorMahmoudpour, Saeed
dc.contributor.authorSchelkens, Peter
dc.contributor.imecauthorMahmoudpour, Saeed
dc.contributor.imecauthorSchelkens, Peter
dc.contributor.orcidimecMahmoudpour, Saeed::0000-0003-1006-1838
dc.contributor.orcidimecSchelkens, Peter::0000-0003-0908-1655
dc.date.accessioned2023-11-17T09:11:59Z
dc.date.available2023-10-20T17:26:27Z
dc.date.available2023-11-17T09:11:59Z
dc.date.issued2022
dc.description.wosFundingTextThe research was funded by Research Foundation -Flanders (FWO) (G0B3521N).
dc.identifier.doi10.1109/ICIP46576.2022.9898064
dc.identifier.eisbn978-1-6654-9620-9
dc.identifier.issn1522-4880
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42844
dc.publisherIEEE
dc.source.beginpage1471
dc.source.conferenceIEEE International Conference on Image Processing (ICIP)
dc.source.conferencedateOCT 16-19, 2022
dc.source.conferencelocationBordeaux
dc.source.endpage1475
dc.source.journalna
dc.source.numberofpages5
dc.title

REVISITING NATURAL SCENE STATISTICAL MODELING USING DEEP FEATURES FOR OPINION-UNAWARE IMAGE QUALITY ASSESSMENT

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions