Publication:
Modeling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1912 since deposited on 2021-10-15
2last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1912 since deposited on 2021-10-15
2last month
Acq. date: 2025-12-10
Citations