Publication:
Random telegraph signal: a local probe for single point defect studies in solid-state devices
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T23:10:19Z | |
| dc.date.available | 2021-10-14T23:10:19Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6827 | |
| dc.source.beginpage | 136 | |
| dc.source.endpage | 143 | |
| dc.source.journal | Materials Science and Engineering B-Solid State Materials for Advanced Technology | |
| dc.source.volume | 91 | |
| dc.title | Random telegraph signal: a local probe for single point defect studies in solid-state devices | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |