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Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices
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Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices
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Date
2002
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nicolett, A.S.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Solid-State Electronics
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1932
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1932
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-15
Citations