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Processing impact of the low-frequency noise of 1.8 V input-output bulk FinFETs
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Processing impact of the low-frequency noise of 1.8 V input-output bulk FinFETs
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Hellings, Geert
;
Arimura, Hiroaki
;
Parvais, Bertrand
;
Ragnarsson, Lars-Ake
;
Dekkers, Harold
;
Schram, Tom
;
Linten, Dimitri
;
Horiguchi, Naoto
;
Simoen, Eddy
;
Boudier, Dimitri
;
Cretu, Bogdan
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1997
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Acq. date: 2025-12-13
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Views
1997
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-13
Citations