Publication:

Reliability analysis of permanent degradations on AlGaN/GaN HEMTs

Date

2013
Journal article
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dc.contributor.authorMarcon, Denis
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorWu, Tian-Li
dc.contributor.authorStoffels, Steve
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorZanoni, Enrico
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-21T09:47:21Z
dc.date.available2021-10-21T09:47:21Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22760
dc.source.beginpage3132
dc.source.endpage3141
dc.source.issue10
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume60
dc.title

Reliability analysis of permanent degradations on AlGaN/GaN HEMTs

dc.typeJournal article
dspace.entity.typePublication
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