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Charge Transport in GaN High Electron Mobility Transistor With Positive Substrate Bias

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dc.contributor.authorHuang, Peng
dc.contributor.authorSmith, Matthew D.
dc.contributor.authorUren, Michael J.
dc.contributor.authorChen, Zequan
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorVohra, Anurag
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorKuball, Martin
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorVohra, Anurag
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecVohra, Anurag::0000-0002-2831-0719
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2025-06-13T04:52:40Z
dc.date.available2025-06-13T04:52:40Z
dc.date.issued2025-JUN 2
dc.description.wosFundingTextThis work was supported in part by the Engineering and Physical Sciences Research Council (EPSRC) under Grant EP/R029393/1 and in part by the U.K. Research and Innovation (UKRI) Innovation and Knowledge Centre Transforming Net Zero with Ultrawide Bandgap Semiconductor Device Technology (REWIRE) under Grant EP/Z531091/1.
dc.identifier.doi10.1109/TED.2025.3571004
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45797
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages6
dc.title

Charge Transport in GaN High Electron Mobility Transistor With Positive Substrate Bias

dc.typeJournal article
dspace.entity.typePublication
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