Publication:

Performance and reliability of high-mobility Si0.55Ge0.45 p-channel FinFETs based on epitaxial cladding of Si fins

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1899 since deposited on 2021-10-22
2last month
2last week
Acq. date: 2026-08-03

Citations

Statistics

Views

1899 since deposited on 2021-10-22
2last month
2last week
Acq. date: 2026-08-03

Citations