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Performance and reliability of high-mobility Si0.55Ge0.45 p-channel FinFETs based on epitaxial cladding of Si fins
Publication:
Performance and reliability of high-mobility Si0.55Ge0.45 p-channel FinFETs based on epitaxial cladding of Si fins
Date
2014
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mertens, Hans
;
Ritzenthaler, Romain
;
Hikavyy, Andriy
;
Franco, Jacopo
;
Lee, Jae Woo
;
Brunco, David
;
Eneman, Geert
;
Witters, Liesbeth
;
Mitard, Jerome
;
Kubicek, Stefan
;
Devriendt, Katia
;
Tsvetanova, Diana
;
Milenin, Alexey
;
Vrancken, Christa
;
Geypen, Jef
;
Bender, Hugo
;
Groeseneken, Guido
;
Vandervorst, Wilfried
;
Barla, Kathy
;
Collaert, Nadine
;
Horiguchi, Naoto
;
Thean, Aaron
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1891
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations
Metrics
Views
1891
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations