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Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETs

Date

2002
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dc.contributor.authorOhyama, H.
dc.contributor.authorHayama, K.
dc.contributor.authorTakakura, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-14T22:34:28Z
dc.date.available2021-10-14T22:34:28Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6655
dc.source.conference8th International Conference on Electronic Materials - IUMRS-ICEM
dc.source.conferencedate10/06/2002
dc.source.conferencelocationXi'an China
dc.title

Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETs

dc.typeOral presentation
dspace.entity.typePublication
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