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Degradation analysis of high performance 14nm FinFET SRAM
Publication:
Degradation analysis of high performance 14nm FinFET SRAM
Date
2018
Proceedings Paper
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41787.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kraak, Daniel
;
Agbo, Innocent
;
Taouil, Motta
;
Hamdioui, Said
;
Weckx, Pieter
;
Cosemans, Stefan
;
Catthoor, Francky
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1865
since deposited on 2021-10-25
Acq. date: 2025-10-28
Citations
Metrics
Views
1865
since deposited on 2021-10-25
Acq. date: 2025-10-28
Citations