Publication:
Application of an inverse Mack model for negative tone development simulation
Date
| dc.contributor.author | Gao, Weimin | |
| dc.contributor.author | Klostermann, Ulrich | |
| dc.contributor.author | Mülders, Thomas | |
| dc.contributor.author | Schmoeller, Thomas | |
| dc.contributor.author | Demmerle, Wolfgang | |
| dc.contributor.author | De Bisschop, Peter | |
| dc.contributor.author | Bekaert, Joost | |
| dc.contributor.imecauthor | De Bisschop, Peter | |
| dc.contributor.imecauthor | Bekaert, Joost | |
| dc.contributor.orcidimec | Bekaert, Joost::0000-0003-3075-3479 | |
| dc.date.accessioned | 2021-10-19T13:40:31Z | |
| dc.date.available | 2021-10-19T13:40:31Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2011 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18942 | |
| dc.source.beginpage | 79732W | |
| dc.source.conference | Optical Microlithography XXIV | |
| dc.source.conferencedate | 27/02/2011 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| dc.title | Application of an inverse Mack model for negative tone development simulation | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |