Publication:
Impacts of quantum effects on linear characteristics and low frequency noise in ultra thin gate oxide deep submicron MOSFETs
Date
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T22:22:54Z | |
| dc.date.available | 2021-10-14T22:22:54Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6596 | |
| dc.source.beginpage | 55 | |
| dc.source.conference | Proceedings of the 5th Annual Workshop on Semiconductor Advances for Future Electronics - SAFE | |
| dc.source.conferencedate | 27/11/2002 | |
| dc.source.conferencelocation | Veldhoven The Netherlands | |
| dc.source.endpage | 60 | |
| dc.title | Impacts of quantum effects on linear characteristics and low frequency noise in ultra thin gate oxide deep submicron MOSFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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