Publication:

Implications of BTI-induced time-dependent statistics on yield estimation of digital circuits

Date

2014
Journal article
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dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-22T08:12:47Z
dc.date.available2021-10-22T08:12:47Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24809
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6719591
dc.source.beginpage666
dc.source.endpage673
dc.source.issue3
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume61
dc.title

Implications of BTI-induced time-dependent statistics on yield estimation of digital circuits

dc.typeJournal article
dspace.entity.typePublication
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