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Low-frequency noise of strained and non-strained n-channel tri-gate FinFETs with different gate dielectrics
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Low-frequency noise of strained and non-strained n-channel tri-gate FinFETs with different gate dielectrics
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukynachikova, N.
;
Garbar, N.
;
Kudina, V.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
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1915
since deposited on 2021-10-18
Acq. date: 2025-12-13
Citations
Metrics
Views
1915
since deposited on 2021-10-18
Acq. date: 2025-12-13
Citations