Publication:

Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs

Date

2020
Proceedings Paper
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dc.contributor.authorLi, Kan
dc.contributor.authorZhang, Enxia
dc.contributor.authorGorchichko, Mariia
dc.contributor.authorWang, Pengfei
dc.contributor.authorHiblot, Gaspard
dc.contributor.authorJourdain, Anne
dc.contributor.authorVan Huylenbroeck, Stefaan
dc.contributor.authorReed, Robert
dc.contributor.authorFleetwood, Daniel
dc.contributor.authorSchrimpf, Ronald
dc.contributor.imecauthorHiblot, Gaspard
dc.contributor.imecauthorJourdain, Anne
dc.contributor.imecauthorVan Huylenbroeck, Stefaan
dc.contributor.orcidimecHiblot, Gaspard::0000-0002-3869-965X
dc.contributor.orcidimecVan Huylenbroeck, Stefaan::0000-0001-9978-3575
dc.date.accessioned2021-10-28T23:53:13Z
dc.date.available2021-10-28T23:53:13Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35465
dc.identifier.urlhttp://www.nsrec.com/2020_session-c.html
dc.source.beginpagePC-6
dc.source.conferenceNuclear & Space Radiation Effects Conference - NSREC
dc.source.conferencedate20/07/2020
dc.source.conferencelocationonline online
dc.title

Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs

dc.typeProceedings paper
dspace.entity.typePublication
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