Publication:

The future of CMOS device reliability assessment: from individual traps to circuit simulations

Date

2012
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-20T11:20:20Z
dc.date.available2021-10-20T11:20:20Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20753
dc.source.conferenceChina Semiconductor Technology International Conference - CSTIC
dc.source.conferencedate18/03/2012
dc.source.conferencelocationShanghai China
dc.title

The future of CMOS device reliability assessment: from individual traps to circuit simulations

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations