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Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices
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Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ahmad, Tareq
;
Devulder, Wouter
;
Opsomer, Karl
;
Minjauw, Matthias
;
Celano, Umberto
;
Hantschel, Thomas
;
Vandervorst, Wilfried
;
Goux, Ludovic
;
Kar, Gouri Sankar
;
Detavernier, Christophe
Journal
ACS Applied Materials & Interfaces
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Views
1889
since deposited on 2021-10-25
2
last month
2
last week
Acq. date: 2026-01-10
Citations