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Resist surface investigations for reduction of line-edge-roughness in surface imaging technology
Publication:
Resist surface investigations for reduction of line-edge-roughness in surface imaging technology
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sugihara, Takashi
;
Van Roey, Frieda
;
Goethals, Mieke
;
Ronse, Kurt
;
Van den hove, Luc
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1914
since deposited on 2021-10-01
1
last month
Acq. date: 2025-12-15
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Metrics
Views
1914
since deposited on 2021-10-01
1
last month
Acq. date: 2025-12-15
Citations