Publication:
Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors
| dc.contributor.author | Kocak, Husnu Murat | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.author | Naskali, Ahmet Teoman | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.date.accessioned | 2023-04-26T09:30:11Z | |
| dc.date.available | 2022-12-01T03:12:29Z | |
| dc.date.available | 2023-04-26T09:30:11Z | |
| dc.date.issued | 2022 | |
| dc.identifier.doi | 10.1109/ICMTS50340.2022.9898251 | |
| dc.identifier.eisbn | 978-1-6654-8566-1 | |
| dc.identifier.issn | 1071-9032 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40811 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 21 | |
| dc.source.conference | 34th IEEE International Conference on Microelectronic Test Structures (ICMTS) | |
| dc.source.conferencedate | MAR 21-APR 15, 2022 | |
| dc.source.conferencelocation | Cleveland | |
| dc.source.endpage | 29 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 9 | |
| dc.subject.keywords | DEFECT PATTERNS | |
| dc.title | Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |