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Scaling below 22 nm: the voltage problem

Date

2011
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dc.contributor.authorLauwereins, Rudy
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.accessioned2021-10-19T15:14:05Z
dc.date.available2021-10-19T15:14:05Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19248
dc.source.conferenceDesign, Automation and Test in Europe Conference - DATE
dc.source.conferencedate14/03/2011
dc.source.conferencelocationGrenoble France
dc.title

Scaling below 22 nm: the voltage problem

dc.typeOral presentation
dspace.entity.typePublication
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