Publication:

Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy

Date

2020
Meeting abstract
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dc.contributor.authorOp de Beeck, Jonathan
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorParedis, Kristof
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorGeiser, Brian
dc.contributor.authorBunton, Joe
dc.contributor.authorUlfig, Robert
dc.contributor.authorLarson, Dave
dc.contributor.imecauthorOp de Beeck, Jonathan
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecOp de Beeck, Jonathan::0000-0003-3471-2156
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.accessioned2021-10-29T01:36:25Z
dc.date.available2021-10-29T01:36:25Z
dc.date.embargo9999-12-31
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35677
dc.identifier.urlhttps://www.atomprobe.com/-/media/ametekatomprobe/files/news-and-events/pdf/aptmprogrammedraft201109.pdf?dmc=1&la=en&revision=ab8adfd1-ecf4-4afa-b90e-80f8a254534f&hash=028E619DEA1AFCAABF7B724B28D040D6
dc.source.beginpage20
dc.source.conferenceAtom Probe Tomography & Microscopy (APT&M) 2020
dc.source.conferencedate16/11/2020
dc.source.conferencelocationOxford United Kingdom
dc.title

Improved atom probe reconstruction through tp shape constraints supplied by scanning probe microscopy

dc.typeMeeting abstract
dspace.entity.typePublication
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