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Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures
Publication:
Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures
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Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fantini, Andrea
;
Wouters, Dirk
;
Degraeve, Robin
;
Goux, Ludovic
;
Pantisano, Luigi
;
Kar, Gouri Sankar
;
Chen, Yangyin
;
Govoreanu, Bogdan
;
Kittl, Jorge
;
Altimime, Laith
;
Jurczak, Gosia
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1876
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations
Metrics
Views
1876
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations