Publication:

Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures

Date

2012

Proceedings Paper

Simple item page Full metadata Statistics

Files

24767.pdf 2.23 MB

Author(s)

Fantini, Andrea

;

;

Degraeve, Robin

;

;

Pantisano, Luigi

;

Kar, Gouri Sankar

;

;

Govoreanu, Bogdan

;

;

Altimime, Laith

;

Statistics

1876 since deposited on 2021-10-20

Acq. date: 2026-02-24