Publication:
GIDL (gate-induced drain leakage) and parasitic Schottky barrier leakage elimination in aggressively scaled HfO2/TiN FiNFET devices
Date
Loading...
Journal
Abstract
Description
Statistics
Views
2076 since deposited on 2021-10-16
3last month
2last week
Acq. date: 2026-08-06
Citations
Statistics
Views
2076 since deposited on 2021-10-16
3last month
2last week
Acq. date: 2026-08-06
Citations