Publication:
Polarity effect on the temperature dependence of leakage current through HfO2/SiO2 gate dielectric stacks
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1946 since deposited on 2021-10-15
3last month
Acq. date: 2026-10-05
Citations
Statistics
Views
1946 since deposited on 2021-10-15
3last month
Acq. date: 2026-10-05
Citations