Publication:
Polarity effect on the temperature dependence of leakage current through HfO2/SiO2 gate dielectric stacks
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1939 since deposited on 2021-10-15
2last month
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Acq. date: 2026-04-06
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Statistics
Views
1939 since deposited on 2021-10-15
2last month
1last week
Acq. date: 2026-04-06
Citations