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A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS
Publication:
A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS
Date
2015
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Parvais, Bertrand
;
Wambacq, Piet
;
Mercha, Abdelkarim
;
Verkest, Diederik
;
Thean, Aaron
;
Hammo, Hiroaki
;
Oishi, Tetsuya
;
Sawada, Ken
;
Nomoto, Kazuki
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1979
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3
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Acq. date: 2025-10-28
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Views
1979
since deposited on 2021-10-22
3
last week
Acq. date: 2025-10-28
Citations