Publication:
High-k / metal Gate 3 (TDDB)
Date
| dc.contributor.author | Kauerauf, Thomas | |
| dc.date.accessioned | 2021-10-21T08:40:55Z | |
| dc.date.available | 2021-10-21T08:40:55Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22569 | |
| dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
| dc.source.conferencedate | 14/04/2013 | |
| dc.source.conferencelocation | Monterey, CA USA | |
| dc.title | High-k / metal Gate 3 (TDDB) | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |