Publication:
Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs
Date
| dc.contributor.author | Kilchytska, V. | |
| dc.contributor.author | Alvarado, J. | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.author | Rooyackers, Rita | |
| dc.contributor.author | Put, Sofie | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Flandre, D. | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-19T14:49:35Z | |
| dc.date.available | 2021-10-19T14:49:35Z | |
| dc.date.issued | 2011 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/19174 | |
| dc.source.beginpage | 18 | |
| dc.source.endpage | 24 | |
| dc.source.issue | 1 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 59 | |
| dc.title | Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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