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Polarity dependent charge trapping in thin SiO2/Al2O3 gate staks with poly-Si gate electrodes: influence of high temperature annealing
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1972 since deposited on 2021-10-14
2last month
Acq. date: 2026-01-05
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Metrics
Views
1972 since deposited on 2021-10-14
2last month
Acq. date: 2026-01-05
Citations